We provide on wafer measurement capabilities for DC, CV, RF, and 1/f noise characterizations including temperature dependence. More specifically the following characterizations are supported.
DC Current Voltage (IV):
- On-wafer/package device
- maximum 5 source monitoring unit
- maximum voltage up to 100V
- maximum current 100mA
Capacitance-Voltage (CV):
- On-wafer/package device
- LCR meter (100kHz to 1MHz)
Temperature Characterization:
- -40 to 200 oC for on-wafer/package device (DC and CV)
- 77K for package device (DC and CV)
RF/S-Parameter Characterization:
- Vector network analyzer (VNA)
- Two-port S-parameter 26MHz to 50 GHz
- Two-port S-parameter upto 110 GHz
1/f Noise Characterization:
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